Tutorials & Papers
End-to-End Imaging Workflow
Kenneth N. Fleisher, National Gallery of Art, Washington, 2014
Optimizing Conformance to FADGI and Metamorfoze
Kenneth N. Fleisher, National Gallery of Art, Washington, 2014
Targeting for Important Color Content: Near Neutrals and Pastels
Don Williams and Peter D. Burns, Proc. IS&T Archiving Conference, 2012
Image Stitching: Exploring Practices, Software and Performance
Don Williams and Peter D. Burns, Proc. IS&T Archiving Conference, 2013
Measurement of Texture Loss for JPEG 2000 Compression
Peter D. Burns and Don Williams, Proc. SPIE Vol. 8293, Image Quality and System Performance IV, 2012
Adapting ISO 20462 Softcopy Quality Ruler Method for on-line Image Quality Studies
Peter D. Burns, Jonathan B. Phillips and Don Williams, Proc. SPIE Vol. 8653, Image Quality and System Performance X, 86530E-1, 2013
Cultural Heritage Imaging
What is an MTF? ... and why you should care?
Don Williams, RLG DigiNews. Feb 1998
Preparing for the Image Literate Decade
D. Williams and P.D. Burns, Proc. IS&T Archiving Conf., IS&T, 124-127, 2009
Imaging Performance Taxonomy
Proc. SPIE-IS&T Electronic Imaging Symposium, 2009, San Jose, CA
Measuring and Managing Digital Image Sharpening
Proc. IS&T 2008 Archiving Conference, pg. 89-93, Bern, Switzerland
Ten Tips for Maintaining Digital Image Quality
P. D. Burns and D. Williams, Proc. Archiving 2007 Conf., IS&T, 16-22, 2007
When Good Scanning Goes Bad: A Case for Enabling Statistical Process Control in Image Digitizing Workflows
Proc. IS&T 2006 Archiving Conference, Ottawa, Canada
Debunking of Specmanship: Progress on ISO/TC42 Standards for Digital Capture Imaging Performance
D. Williams, Proc. PICS Conf, Volume 7, Number 1, 2003
Digital Camera and Scanner Performance
A Pilot Study of Digital Camera Resolution Metrology Protocols Proposed Under ISO 12233, Edition 2
Don Williams Proc. SPIE, Image Quality and System Performance. 2010
The Array Scanner as Microdensitometer Surrogate: A Deal with the Devil or... a Great Deal?
Don Williams Proc. SPIE, Image Quality and System Performance. 2009
Color Inconstancy Index: A Proposal and Case Study for Consumer Digital Cameras
Don Williams, IS&T' PICS Conference, 181-184, 2002
Image Capture Simulation Using an Accurate and Realistic Lens Model
Ralph Short, Don Williams, and Andrew E.W. Jones, IS&T/SPIE Conference on Sensors, Cameras, and Applications, SPIE Vol. 3650, January 1999
Benchmarking of the ISO 12233 Slanted-edge Spatial Frequency Response Plug-in
Don Williams, Proc. IS&T PICS Conf. IS&T, 133-136, 1998
Distilling Noise Sources for Digital Capture Devices
Peter D. Burns and Don Williams, Proc. IS&T PICS Conf., pg. 132-136, 2001
Refined Slanted-Edge Measurement for Practical Camera and Scanner Testing
Peter D. Burns and Don Williams, Proc. IS&T PICS Conf., pg. 191-195, 2002
Low-Frequency MTF Estimation for Digital Imaging Devices Using Slanted Edge Analysis
Don Williams and Peter D. Burns, Proc. SPIE-IS&T Electronic Imaging Symposium, SPIE vol. 5294, pg. 93-101, 2004
Human-Readable Preservation of Digital Images to Microfilm
Don Williams and Peter D. Burns, Proc. IS&T Archiving Conf., pg. 183-186, IS&T, 2004
Scanners for Analytic Print Measurement the devil in the details
Eric K. Zeise, Don Williams, Peter D. Burns and William C. Kress Proc. SPIE Vol. 6494, Image Quality and System Performance IV, 64940L, 2007
Sampling Efficiency in Digital Camera Performance Standards
Peter D. Burns and Don Williams, Proc. SPIE Vol. 6808, 2008
Applying and Extending ISO/TC42 Digital Camera Resolution Standards to Mobile Imaging Products
D. Williams and P. D. Burns, Proc. SPIE-IS&T Electronic Imaging Symposium, SPIE, Vol. 6494, 2007
Identification of Image Noise Sources in Digital Scanner Evaluation
P. D. Burns and D. Williams, Proc. SPIE-IS&T Electronic Imaging Symposium, SPIE, Vol. 5294, 114-123, 2004
Diagnostics for Digital Capture Using MTF
D. Williams and P. D. Burns, Proc. PICS Conf., 227-232, IS&T, 2001
Slanted-Edge MTF for Digital Camera and Scanner Analysis
P. D. Burns, Proc. PICS Conf., IS&T, 135-138, 2000
Using Slanted-Edge Analysis for Color Registration Measurement
P. D. Burns and D. Williams, Proc. PICS Conf., IS&T, 51-53, 1999